Digital Integrated Circuit Testing from a Quality Perspective - Hardcover
$178.18
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Digital Integrated Circuit Testing from a Quality Perspective - Hardcover
$178.18
by Eugene R. Hnatek (Author)
Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
Number of Pages: 180
Dimensions: 0.65 x 9.72 x 6.24 IN
Illustrated: Yes
Publication Date: August 31, 1993
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